Silicon nitride AFM probes with 14 - 16 um height silicon nitride tips for imaging tall biological objects. Each chip contains 4 Silicon Nitride Cantilevers, Triangular, resonance frequency 10-30 kHz, force constant 0.03 to 0.24 N/m, Tip Radius < 30 nm.
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with Au conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m.
High Accuracy NonContact AFM probes HA_NC series with Au conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.
High Accuracy NonContact AFM probes PHA_NC series, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m. Narrow pencil-shaped tips for high quality AFM imaging.
High Accuracy Contact AFM probes HA_C series with Pt tip and reflective coating, each chip has 2 cantilevers, resonant frequency 37 kHz / 19 kHz, force constant 0,65 N/m / 0,26 N/m.
