Super Sharp AFM probes

Super sharp silicon probes with typical curvature radius 1-2nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers.


NSG30_SS

Super Sharp AFM Probes for noncontact/semicontact modes NSG30 series, resonant frequency 200-440kHz, force constant 22-100N/m, Al reflective coating.

HA_HR_DLC

Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series HA_HR.

HA_NC_DLC

Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series HA_NC.
Copyright © 2017 - 2021 ScanSens. All rights reserved.