Test grating TGT1 is intended for for 3-D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control.
NEW!!! High Accuracy High Resonance frequency noncontact AFM probes HA_NC series with stable and wear-resistant long lifetime W2C conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m. W2C+ conductive coating is modified to provide better stability in high humidity conditions.
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with Au conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m.
