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About company
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Application notes
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AFM-TERS related products
AFM probe ETALON series
Noncontact/Semicontact/Force Modulation AFM probes ETALON series
Contact AFM probes
Conductive AFM probes ETALON series
Magnetic Probes
Tipless AFM cantilevers
Etalon cantilevers with Full Diamond (FD) tips
AFM probes ETALON Premium series
Noncontact AFM probes ETALON Premium series
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Noncontact/Semicontact probes
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Contact Probes
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Silicon Nitride Cantilevers
Cantilever sets
Super Sharp AFM probes
High aspect ratio AFM cantilevers
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TOP VISUAL Probes
SNOM cantilevers *NEW*
SNOM fiber probes
400-550nm
450-600nm
600-770nm
780-970nm
980-1600nm
Calibration Gratings
AFM calibration
Grating sets
HOPG, Substrates, Test Samples
HOPG ZYA quality
HOPG ZYB quality
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Mica
Test samples
Customized colloidal probes *NEW*
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Colloidal probes on Golden series cantilevers
Vibration isolation systems
ScanSens AFM probes and test samples
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Category
AFM-TERS related products
AFM probe ETALON series
AFM probes ETALON Premium series
AFM probes GOLDEN series
Cantilever sets
Super Sharp AFM probes
Scan-Gallery
High aspect ratio AFM cantilevers
Diamond Coated Conductive Probes
TOP VISUAL Probes
SNOM cantilevers
new
SNOM fiber probes
Calibration Gratings
HOPG, Substrates, Test Samples
Customized colloidal probes
new
Colloidal probes
Vibration isolation systems
Scan-Gallery
Examples of DLC probes applications
Sample:
Porous anodic aluminum oxide on the Al base.
Pores diameter 250-300nm. Pores distance ͂ 80nm. Thickness of oxide layer >10µm.
Probe:
NSG01_DLC
SEM photo of the porous aluminum oxide
AFM image of the porous aluminum oxide
Sample
: Pyramidal Ge quantum dots grown on Si(001)
Image courtesy
: Mr. Chris Petz (University of Virginia)
Scan size:
2x2 µm
Probe
: NSG01_DLC
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