Colloidal Probe Atomic Force Microscopy requires a tip of known shape to be mounted cleanly on a consistently reproducible cantilever. These probes are known as “Colloidal Probes” and are used to study colloidal interactions between two surfaces and to quantify the interactive properties. The tip is formed using a spherical, colloidal particle that is attached to a tipless cantilever. Сolloidal probes are manufactured in the state-of-the-art clean room using micromachining techniques and a high precision, 6 axis, micromanipulator stage system. Near perfect micro-spheres of various materials are attached at the end of tipless cantilevers using a proprietary, clean, contamination free process.
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Material
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Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
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Chip size
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3.4x1.6x0.3mm
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Cantilever number
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1 rectangular, tipless
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Reflective side
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Au
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Available types of colloidal probes
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SiO2 (only size A), BSG
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Sphere size
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A - 5 um to 9 um
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Available sizes of BSG spheres (for SiO2 spheres available only size A)
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B - 10 um to 14 um
C - 20 um or more
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Tipless cantilever specification:
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Cantilever length, L±10µm |
Cantilever width, W±6µm
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Cantilever thickness,
T±0.5 µm
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Resonant frequency, kHz
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Force constant, N/m
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min
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typical
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max
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min
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typical
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max
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|||
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225
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27
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2.7
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43
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62
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81
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0.6
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1.6
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3.7
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