Colloidal probes for Noncontact/Semicontact Mode

Colloidal Probe Atomic Force Microscopy requires a tip of known shape to be mounted cleanly on a consistently reproducible cantilever. These probes are known as “Colloidal Probes” and are used to study colloidal interactions between two surfaces and to quantify the interactive properties. The tip is formed using a spherical, colloidal particle that is attached to a tipless cantilever. Сolloidal probes are manufactured in the state-of-the-art clean room using micromachining techniques and a high precision, 6 axis, micromanipulator stage system. Near perfect micro-spheres of various materials are attached at the end of tipless cantilevers using a proprietary, clean, contamination free process.

Colloidal Probe Application

Colloidal Probe applications include direct surface force measurement, colloidal interactions on the single particle-particle level, direct measurement of cell mechanics, measurement of adhesion forces, study of colloidal interactions between particle and surface. These are just a few application out of a fast growing field using colloidal probe technique.

Colloidal Probe Specification

Material	Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size	3.4x1.6x0.3mm
Cantilever number	1 rectangular, tipless
Reflective side	Au
Type of colloidal spheres	SiO2/BSG

Sphere size	A - 5 um to 9 um
Available sizes of BSG spheres (SiO2 spheres available only with A size)	B - 10 um to 14 um C - 20 um or more

Tipless cantilever specification:

Cantilever length, L±10µm	Cantilever width, W±6µm	Cantilever thickness, T±0.5 µm	Resonant frequency, kHz			Force constant, N/m
Cantilever length, L±10µm	Cantilever width, W±6µm	Cantilever thickness, T±0.5 µm	min	typical	max	min	typical	max
125	30	4.0	200	300	400	13	37	77

Ordering code:

CPN _ SiO2 - A / Au / 5

PROBE SERIES _ TYPE OF SPHERES – SIZE / Reflective Coating / ORDERING NUMBER