Due to the medium meanings of force constant and resonant frequency the probes can be used in contact, semicontact and noncontact modes.
Specially designed for the applications when it's not clearly defined which mode should be used for sample investigation or when it's necessary to provide measurements in both modes of the same sample area without tip remove.
Specification of HA_CNC probe series:
monocrystal silicon tip
|Chip size||3.6 x 1.6 x 0.4 mm|
|Cantilever number||2 rectangular|
|Tip shape||Octahedral at the base, conic on the last 200 nm|
|Tip cone angle φ||30 degrees on the last 200nm|
|Full tip height||≥10 µm|
|Tip curvature radius|| less than 10nm
|Cantilever type||A||B||Typical dispersion|
|Length, L (µm)||224||184||± 2|
|Width, W (µm)||34||34||± 3|
|Thickness, H (µm)||1.85||1.85||± 0.15|
|Force Constant (N/m)||1.0||1.5||±20%|
|Resonant frequency (kHz)||46||66||± 10%