ETALON is a new series of excellent composite AFM probes.

In terms of quality-to-price ratio, it has no analogues in the world market.
 
Stable and nondestructive, wear resistant probes with conductive diamond coating allow you to make as many images as you want!
 
Specification of HA_HR_DCP probe series:
 
 Material
 Polysilicon lever,
 monocrystal silicon tip
 Chip size  3.6 x 1.6 x 0.4 mm

 Reflective side

 Tip side

 Au (20-30 nm)

 Highly doped diamond (~100nm thickness),  doping level:  6’000-8’000ppm B.

 Cantilever number  2 rectangular
 Tip shape  Octahedral at the base, conic on the last 200 nm
 Tip cone angle φ  30 degrees on the last 200 nm
 Full tip height  ≥10 µm
 Pedestal/tip ratio  1:1
 Tip curvature radius  ~100nm

 

 

 

Cantilever type A B Typical dispersion
Length, L (µm) 93 123 ± 2
Width, W (µm) 34 34 ± 3
Thickness, H (µm) 3 3 ± 0.15
Force Constant (N/m) 34 17 ±20%
Resonant frequency (kHz) 380 230 ± 10%

 

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