Silicon Nitride Sharp (SNS) AFM probes consist of a silicon nitride cantilever with low stiffness and a sharp silicon integrated tip. They were specially designed for AFM topography imaging of soft biological samples in liquid environment. Their features, listed below, were optimized for high-quality scans acquisition:
Tip Specifications | |
Material | Silicon |
Height (μm) | 3.5 |
ROC (nm) | < 10 |
Shape | Pyramid |
Metal Coating | None |
Cantilever Specifications | |
Material | Silicon Nitride |
Shape | V-Shape |
Reflex Side Coating | Au |
Value |
Cantilever length, L±10µm |
Cantilever width, W±5µm |
Cantilever thickness, T±0.025 µm |
Resonant frequency, kHz |
Force constant, N/m |
||||
min | typical | max | min | typical | max | ||||
Lever A | 100 | 13.5 | 0.5 | 40 | 69 | 98 | 0.05 | 0.3 | 0.55 |
Lever B | 200 | 28 | 0.5 | 10 | 17 | 27 | 0.02 | 0.06 | 0.11 |
Lever C | 100 | 13.5 | 0.5 | 40 | 69 | 98 | 0.05 | 0.3 | 0.55 |
Lever D | 200 | 28 | 0.5 | 10 | 17 | 27 | 0.02 | 0.06 | 0.11 |