| TOP VISUAL NONCONTACT Silicon Cantilevers VIT_P series |
TOP VISUAL probes intended:
1. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
2. For precise positioning of a tightly focused laser spot at the tip end - for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).
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Image in optical microscope
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VIT_P series specification |
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Material |
Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped |
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Chip size |
3.4x1.6x0.3mm |
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Reflective side coating |
None |
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Front coating |
None |
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Cantilever number |
1 rectangular |
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Tip curvature radius |
typical 6nm, guaranteed 10nm |
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Tip shape |
Pyramidal |
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Tip height |
10-15 um |
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Cantilever series |
Cantilever length, L±10µm |
Cantilever width, W±5µm |
Cantilever thickness, T±1 µm |
Resonant frequency, kHz |
Force constant, N/m |
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min |
typical |
max |
min |
typical |
max |
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VIT_P |
160 |
45 |
4.6 |
210 |
335 |
490 |
12 |
45 |
110 |
