| TOP VISUAL CONTACT Silicon Cantilevers VIT_P_C-A series |
TOP VISUAL probes intended:
1. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
2. For precise positioning of a tightly focused laser spot at the tip end - for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).
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Image in optical microscope
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VIT_P_C-A series specification |
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Material |
Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped |
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Chip size |
3.4x1.6x0.3mm |
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Reflective side coating |
Al |
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Front coating |
None |
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Cantilever number |
1 rectangular |
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Tip curvature radius |
typical 6nm, guaranteed 10nm |
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Tip shape |
Pyramidal |
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Tip height |
14-16 um |
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Cantilever series |
Cantilever length, L±20µm |
Cantilever width, W±1µm |
Cantilever thickness, T±1 µm |
Resonant frequency, kHz |
Force constant, N/m |
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min |
typical |
max |
min |
typical |
max |
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VIT_P_C-A |
450 |
50 |
2.5 |
8 |
16 |
25 |
0.6 |
0.3 |
1 |
