VIT_P/Pt

TOP VISUAL NONCONTACT Silicon Cantilevers VIT_P/Pt series

TOP VISUAL probes are intended:
1. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
2. For precise positioning of a tightly focused laser spot at the tip end - for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).

Image in optical microscope
(TOP VISUAL probe is under the investigated sample).

Topography image of the sample made by TOP VISUAL probe.

This model includes:

1. Tip-side conductive cover made of Pt;

2. Reflection-side cover for better AFM laser reflection made of Pt

VIT_P series specification

Material	Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size	3.4x1.6x0.3mm
Reflective side coating	Pt
Front coating	Pt
Cantilever number	1 rectangular
Tip curvature radius	25 - 35 nm
Tip shape	Pyramidal
Tip height	14-16 um

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

VIT_P/Pt

140

5.0

200

300

400