CSG30/Pt

High Resolution CONTACT/SEMICONTACT "GOLDEN" Silicon Cantilevers CSG30 series with PtIr conductive coating.

Due to the medium meanings of force constant and resonant frequency the probes can be used in contact, semicontact and noncontact modes.
Specially designed for the applications when it's not clearly defined which mode should be used for sample investigation or when it's necessary to provide measurements in both modes of the same sample area without tip remove.

CSG30/Pt series specification

Material	Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size	3.4x1.6x0.3mm
Reflective side	PtIr
Conductive coating	PtIr (25nm), Cr adhesion layer (25A)
Cantilever number	1 rectangular
Tip curvature radius	~ 35nm
Available CSG01 probe	bare, tipless, with Al reflective coating

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

CSG30

190

1.5

0.13

0.6