NSG01

High Resolution NONCONTACT "GOLDEN" Silicon AFM Probes NSG01 series

NSG01 series specification

Material	Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size	3.4x1.6x0.3mm
Reflective side	Au
Cantilever number	1 rectangular
Tip curvature radius	typical 6nm, guaranteed 10nm
Available coatings	conductive PtIr, TiN,Au; magnetic CoCr
Available probe	bare, tipless, with Al reflective coating

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

NSG01

125

2.0

150

230

1.45

5.1

15.1