NSG01/TiN

High Resolution NONCONTACT "GOLDEN" Silicon Cantilevers NSG01 series with TiN conductive coating

AFM cantilevers with TiN conductive coating well suit for a work in both conductive contact (Spreading resistance) and electrical semicontact (KPFM, EFM) modes.

Probes of this type:

offer perfect voltage stability (up to 6V) and wear resistance;
are well-conductive for work in Spreading resistance mode;
coated with reflective Au layer from the top side.

NSG01/TiN series specification:

Material	Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size	3.4x1.6x0.3mm
Reflective side	Au
Tip side	TiN
Cantilever number	1 rectangular
Tip curvature radius	25 - 35 nm
Available probe	bare, tipless, with Al reflective coating

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

NSG01

125

2.0

150

230

1.45

5.1

15.1