NSG03

High Resolution NONCONTACT "GOLDEN" Silicon AFM probes NSG03 series

NSG03 series specification

Material	Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size	3.4x1.6x0.3mm
Reflective side	Au
Cantilever number	1 rectangular
Tip curvature radius	typical 6nm, guaranteed 10nm
Available coatings	conductive PtIr, Au;
Available probe	bare, tipless, with Al reflective coating

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

NSG03

135

1.5

150

0.35

1.74

6.1