NSG30

High Resolution NONCONTACT "GOLDEN" Silicon Cantilevers NSG30 series

NSG30 series specification

Material	Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size	3.4x1.6x0.3mm
Reflective side	Al
Cantilever number	1 rectangular
Tip curvature radius	typical 6nm, guaranteed 10nm
Available coatings	conductive PtIr, Au
Available probe	bare, tipless, with Al reflective coating

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±5µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

NSG30

125

4.0

240

320

440

100