High Resolution NONCONTACT "GOLDEN" Silicon Cantilevers NSG30 series with PtIr conductive coating

 

NSG30/Pt series specification

 

Material

Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped

Chip size

3.4x1.6x0.3mm

Reflective side

Pt

Conductive coating

PtIr (25nm), Cr adhesion layer (25A)

Cantilever number

1 rectangular

Tip curvature radius

~ 35nm

Also available coatings

conductive TiN, Au

Available NSG30 probes 

bare, tipless, with Al reflective coating

 

 

 

   

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

NSG30

125

40

4.0

240

320

440

22

40

100

 


 

 

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