AFM cantilevers with conductive coating TiN

21.07.2016

We’re glad to announce that AFM probes with titanium nitride (TiN) coating have appeared in our assortment.

High hardness of this material and its melting temperature around 3500 C provides its utility in wide range of applications.

Our practice of AFM measurements shows that thin films of TiN spread over AFM cantilever’s tip’s end are stable in high currents and any standard force loads that arise in the contact AFM technique. First cantilevers with conductive TiN coating were prepared and investigated in 1998 as the result of the common project of our partners, NT-MDT and State Research Institute for Problems in Physics (V. Shevyakov, S. Lemeshko, V. Roschin. Conductive SPM probes of base Ti or W refractory compounds. Nanotechnology, 9 (1998) 352-355).

Now TiN coated AFM cantilevers are presented in our stock by models: NSG01/TiN and FMG01/TiN. If you need AFM probes with other resonance and stiffness parameters, please, don’t hesitate to write to sales@scansens.com (Evgeniy Lisov). In future we’re going to extend TiN assortment over all models of Golden series.