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AFM-TERS related products
AFM probe ETALON series
Noncontact/Semicontact/Force Modulation AFM probes ETALON series
Contact AFM probes
Conductive AFM probes ETALON series
Magnetic Probes
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Etalon cantilevers with Full Diamond (FD) tips
AFM probes ETALON Premium series
Noncontact AFM probes ETALON Premium series
AFM probes GOLDEN series
Noncontact/Semicontact probes
Force Modulation Probes
Contact Probes
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Silicon Nitride Cantilevers
Cantilever sets
Super Sharp AFM probes
High aspect ratio AFM cantilevers
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TOP VISUAL Probes
SNOM cantilevers *NEW*
SNOM fiber probes
400-550nm
450-600nm
600-770nm
780-970nm
980-1600nm
Calibration Gratings
AFM calibration
Grating sets
HOPG, Substrates, Test Samples
HOPG ZYA quality
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Mica
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Customized colloidal probes *NEW*
Colloidal probes
Colloidal probes on Golden series cantilevers
Vibration isolation systems
ScanSens AFM probes and test samples
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New TGZ4 grating
Category
News
ScanSens calibration gratings have been included in Russian st...
SiC sample
New TGZ4 grating
PFM03
ETALON probes
New biological sample BS01
Etalon product line
Further Extension of ETALON product line
W2C coated probes
New Etalon AFM probes for magnetic measurements
New model of Etalon probes for both contact and amplitude modultation modes
ScanSens presents conductive probes with the modified coating W2C+
AFM cantilevers with conductive coating TiN
Single crystal diamond AFM probes with high aspect ratio
Expanding the line of TERS products
New HOPG test samples available
Vibration isolation solutions for AFM, SEM
Cantilevers with full diamond tips for routine measurements
Test sample for AFM tip's radius investigation
SPM-2018
Etalon Premium: pencil-shape tips for HQ AFM topography scans
Legal Disclosure/Impressum
New TGZ4 grating
14.10.2011
TGZ4 - new calibration grating
in the TGZ series is available now! Step height 1317nm, period 3um.
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