Cantilevers with full diamond tips for routine measurements
15.03.2018
Even full automatic atomic force microscopes are not so easy equipment to deal with. Based on wide and complicated theory of surfaces' interaction AFM method is full of uncertainties. And sometimes only the experienced engineer can say, what does "that artifact" on the image really mean. The one may spend several hours to find the correct parameters... But, according to our experience, sometimes it's enough just to change a cantilever!
AFM cantilevers with full diamond tips are just the ones, that could significantly improve your AFM images:
- Hard diamond needles are more reliable as their wear off is several times slower than of silicon ones. So in most cases, scanning by a full diamond tip the one doesn't need to think about how a probe changes its shape between the first and the last lines of the scan...
- Diamond is the material with low surface energy. Are you tired of horizontal and vertical hooks on scans, which appear when a probe "catches" sticky particles from a sample? Full diamond probe is several times less sticky for biological objects, as experiments of our colleagues have showed.
- Narrow and hard tips also fit all conditions for conducting simple nanoindentation experiments with standard AFM parts.
Combining our own technology of manufacturing polysilicon cantilevers and method of attachment of CVD-grown full diamond needles, we're glad to present you the new products: AFM cantilevers with full diamond needles. Their excellent parameters, the same and better than of stadard silicon ones, allow them to get high quality topography images. And their reasonable price make them well-suitable for routine AFM measurements.
For more information, please, visit
FD probes page of our web-site. Feel free to
contact us if any questions will appear!
