News

New TGZ4 grating

14.10.2011

TGZ4 - new calibration grating in the TGZ series is available now! Step height 1317nm, period 3um.

SiC sample

10.06.2011

New products -  Silicon Carbide sample for accurate small scale calibration of AFM scanners with near uniform distribution of half-monolayer high (0.75 nm) or monolayer high (1.5 nm) steps.

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